Fault finding on transistors by the MOS transistor testing selector:

• Measure parameters: Open voltage UGS (th), internal resistance RDS, Transconductance gm, Withstand voltage V (BR) DS
• Test range: UGS (th) 0.1-9.9V; RDS 0.001-9.999Ω gm; 0.10-10.00s; V (BR) DS 50-650V
• Test current range: 0.1A-5A adjustable, comply with different working situation
• Automatic selecting, out of limit alarming, advance the work efficiency
• The technique of testing RDS under the big-current, is advanced technique